Metrics

From
AFLISR Algorithm Distribution Reliability Fault by Amit Sachan and Ashish Ranjan American Journal of Electrical and Electronic Engineering. 2015, 3(1), 17-21 doi:10.12691/ajeee-3-1-4
Views
14336
Html 13822
Abstract 514
18 March 2015 (publication date) through 17 June 2026 *
14.18 % of article views led to PDF downloads *
*Although we update our data on a daily basis, there may be a 48-hour delay before the most recent numbers are available.
Downloads: 8363
PDF2033
Epub1647
XML2303
PPT598
Figures1170
Tables612
Export: 4931
RIS1601
BibTex1643
Endnote1687
RIS, BibTex, EndNote allows users to search, retrieve and store citations from bibliographic databases such as ABI Inform, the Web of Science, Anthropological Literature, the MLA bibliography, or the catalogs of individual libraries.
Area Chart Example: If your want to see the details of daily statistics for this article, please click here to login our Manuscript Tracking System.
Citations
0
Found additional citations for the article? Please contact us at submission@sciepub.com.
Shares & bookmarks
Facebook0
Twitter0
LinkedIn0
Google +0
Found additional shares or bookmarks for the article? Please contact us at submission@sciepub.com