Figure 2. Line profiles showing topographical heights on TiO2 film annealed at 1oC/min (Inset- 3D image with lines where profiles were obtained)

From

Effect of Annealing Rates on Surface Roughness of TiO2 Thin films

Benjamin M. John, Simon W. Mugo, James M. Ngaruiya

Journal of Materials Physics and Chemistry. 2018, 6(2), 43-46 doi:10.12691/jmpc-6-2-3