Figures index

From

Structural and Optical Properties of Different Composition of Se90Cd10-xInx thin Films by Vacuum Evaporation Technique

D.K. Dwivedi, Nitesh Shukla, H.P. Pathak, Kedar Singh

American Journal of Materials Science and Engineering. 2014, 2(2), 13-17 doi:10.12691/ajmse-2-2-1
  • Figure 1. XRD pattern of Se90Cd10-xInx (x=2, 4, 6&8) thin films
  • Figure 2. Variation of absorption coefficient (α) with photon energy (hν) in Se90Cd10-xInx (x=2, 4, 6&8) thin films
  • Figure 3. Variation of (αhν)2with (hυ) in Se90Cd10-x Inx (x = 2,4,6 & 8) thin films
  • Figure 4. Variation of optical band gap (Eg) with In concentration in Se90Cd10-x Inx (x = 2, 4, 6 & 8) thin films
  • Figure 5. Variation of extinction coefficient (k) with wavelength (λ) in Se90Cd10-xInx (x = 2, 4, 6 & 8) thin films