Metrics

From
Face Recognition Using Line Edge Mapping Approach by Ibikunle F, Agbetuyi F. and Ukpere G American Journal of Electrical and Electronic Engineering. 2013, 1(3), 52-59 doi:10.12691/ajeee-1-3-4
Views
40500
Html 39973
Abstract 527
15 November 2013 (publication date) through 08 November 2025 *
8.65 % of article views led to PDF downloads *
*Although we update our data on a daily basis, there may be a 48-hour delay before the most recent numbers are available.
Downloads: 27416
PDF3505
Epub1492
XML2226
PPT7020
Figures8974
Tables4199
Export: 4371
RIS1403
BibTex1412
Endnote1556
RIS, BibTex, EndNote allows users to search, retrieve and store citations from bibliographic databases such as ABI Inform, the Web of Science, Anthropological Literature, the MLA bibliography, or the catalogs of individual libraries.
Area Chart Example: If your want to see the details of daily statistics for this article, please click here to login our Manuscript Tracking System.
Citations
1
Found additional citations for the article? Please contact us at submission@sciepub.com.
Shares & bookmarks
Facebook0
Twitter0
LinkedIn0
Google +0
Found additional shares or bookmarks for the article? Please contact us at submission@sciepub.com