Figures index

From

Application of Haar Wavelets and Method of Moments for Computing Performance Characteristics of Electromagnetic Materials

Vishwa Nath Maurya, Avadhesh Kumar Maurya

American Journal of Applied Mathematics and Statistics. 2014, 2(3), 96-105 doi:10.12691/ajams-2-3-3
  • Figure 1. Morlet or Modulated Gaussian wavelet
  • Figure 2. Mexican hat wavelet
  • Figure 3. The Shannon wavelet
  • Figure 4. The Haar wavelet in a finite straight
  • Figure 5. Representation of the Haar function for two-dimensions and one level of resolution
  • Figure 6. Current in the conductor
  • Figure 7. The surface charge (pC/m) on a 1.0m straight wire for 32 subdivisions
  • Figure 8. The surface charge (pC/m) on a 1.0 by 1.0m plate for 16 subdivisions
  • Figure 9. The computing time (s) as a function of the subdivision axe number
  • Figure 10. The Haar matrix
  • Figure 11. Value of the threshold of 0.01% (23528 non-zero elements)
  • Figure 12. Value of a threshold of 0.05% (12232 non-zero elements)
  • Figure 13. Variation of the charge surface density as a function of a selected threshold
  • Figure 14. Matrix configuration after applying the Cholesky decomposition for the threshold equal to 0.01%
  • Figure 15. Electric field simulation
  • Figure 16. Superficial charge distribution
  • Figure 17. Wavelet Coefficients as function of the resolution level
  • Figure 18. Statistical data of the usage of the Haar wavelet with a level 5 resolution
  • Figure 19. Superficial charge distribution with different resolution levels