Metrics

From
Effect of Annealing Rates on Surface Roughness of TiO2 Thin films by Benjamin M. John, Simon W. Mugo and James M. Ngaruiya Journal of Materials Physics and Chemistry. 2018, 6(2), 43-46 doi:10.12691/jmpc-6-2-3
Views
19179
Html 18511
Abstract 668
19 December 2018 (publication date) through 17 September 2026 *
12.06 % of article views led to PDF downloads *
*Although we update our data on a daily basis, there may be a 48-hour delay before the most recent numbers are available.
Downloads: 14568
PDF2313
Epub2380
XML1620
PPT4424
Figures3294
Tables537
Export: 6729
RIS2189
BibTex2455
Endnote2085
RIS, BibTex, EndNote allows users to search, retrieve and store citations from bibliographic databases such as ABI Inform, the Web of Science, Anthropological Literature, the MLA bibliography, or the catalogs of individual libraries.
Area Chart Example: If your want to see the details of daily statistics for this article, please click here to login our Manuscript Tracking System.
Citations
0
Found additional citations for the article? Please contact us at submission@sciepub.com.
Shares & bookmarks
Facebook0
Twitter0
LinkedIn0
Google +0
Found additional shares or bookmarks for the article? Please contact us at submission@sciepub.com