Table 1. Measured film thickness and surface roughness of AZO with different Al concentrations

From

Photovoltaic Properties of Aluminum Doped Zinc Oxide Electrodes Based on Variation of Aluminum Impurities in the Semiconductor

M. D. Tyona, R. U. Osuji, C. D. Lokhande, F. I. Ezema

Journal of Materials Physics and Chemistry. 2018, 6(1), 9-16 doi:10.12691/jmpc-6-1-2