Metrics

From
Diagnostics of Product Defects by Clustering and Machine Learning Classification Algorithm by Kamil Židek and Vladislav Maxim Journal of Automation and Control. 2015, 3(3), 96-100 doi:10.12691/automation-3-3-11
Views
33409
Html 32579
Abstract 830
16 December 2015 (publication date) through 12 August 2026 *
9.43 % of article views led to PDF downloads *
*Although we update our data on a daily basis, there may be a 48-hour delay before the most recent numbers are available.
Downloads: 27066
PDF3151
Epub2395
XML2745
PPT7666
Figures10539
Tables570
Export: 6655
RIS2025
BibTex2452
Endnote2178
RIS, BibTex, EndNote allows users to search, retrieve and store citations from bibliographic databases such as ABI Inform, the Web of Science, Anthropological Literature, the MLA bibliography, or the catalogs of individual libraries.
Area Chart Example: If your want to see the details of daily statistics for this article, please click here to login our Manuscript Tracking System.
Citations
0
Found additional citations for the article? Please contact us at submission@sciepub.com.
Shares & bookmarks
Facebook0
Twitter0
LinkedIn0
Google +0
Found additional shares or bookmarks for the article? Please contact us at submission@sciepub.com