Metrics

From
Structural and Optical Investigations of Amorphous Se75-xTe25Sbx Thin Films by D. K. Dwivedi, H. P. Pathak, R. K. Shukla and A. Kumar American Journal of Materials Science and Engineering. 2013, 1(3), 46-49 doi:10.12691/ajmse-1-3-3
Views
22991
Html 22389
Abstract 602
05 September 2013 (publication date) through 04 December 2021 *
15.53 % of article views led to PDF downloads *
*Although we update our data on a daily basis, there may be a 48-hour delay before the most recent numbers are available.
Downloads: 14557
PDF3570
Epub1044
XML1401
PPT3725
Figures3714
Tables1103
Export: 3098
RIS1019
BibTex1004
Endnote1075
RIS, BibTex, EndNote allows users to search, retrieve and store citations from bibliographic databases such as ABI Inform, the Web of Science, Anthropological Literature, the MLA bibliography, or the catalogs of individual libraries.
Area Chart Example: If your want to see the details of daily statistics for this article, please click here to login our Manuscript Tracking System.
Citations
8
Found additional citations for the article? Please contact us at submission@sciepub.com.
Shares & bookmarks
Facebook0
Twitter0
LinkedIn0
Google +0
Found additional shares or bookmarks for the article? Please contact us at submission@sciepub.com