Metrics

From
Face Recognition Using Line Edge Mapping Approach by Ibikunle F, Agbetuyi F. and Ukpere G American Journal of Electrical and Electronic Engineering. 2013, 1(3), 52-59 doi:10.12691/ajeee-1-3-4
Views
26979
Html 26544
Abstract 435
15 November 2013 (publication date) through 26 February 2020 *
9.59 % of article views led to PDF downloads *
*Although we update our data on a daily basis, there may be a 48-hour delay before the most recent numbers are available.
Downloads: 16930
PDF2587
Epub600
XML957
PPT3337
Figures6719
Tables2730
Export: 1909
RIS604
BibTex591
Endnote714
RIS, BibTex, EndNote allows users to search, retrieve and store citations from bibliographic databases such as ABI Inform, the Web of Science, Anthropological Literature, the MLA bibliography, or the catalogs of individual libraries.
Area Chart Example: If your want to see the details of daily statistics for this article, please click here to login our Manuscript Tracking System.
Citations
1
Found additional citations for the article? Please contact us at submission@sciepub.com.
Shares & bookmarks
Facebook0
Twitter0
LinkedIn0
Google +0
Found additional shares or bookmarks for the article? Please contact us at submission@sciepub.com